Optical, electrical, and EPR studies of polycrystalline Al:Cr:ZnSe gain elements

被引:1
|
作者
Watkins, R. [1 ]
Fedorov, V. V. [1 ]
Zvanut, M. E. [1 ]
Bhandari, S. [1 ]
Barnakov, Y. [2 ]
Mirov, S. B. [1 ]
机构
[1] Univ Alabama Birmingham, Dept Phys, Birmingham, AL 35294 USA
[2] IPG Photon Southeast Technol Ctr, Birmingham, AL 35211 USA
关键词
LASERS;
D O I
10.1364/OME.486169
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Transition metal-doped II-VI (TM:II-VI) chalcogenides are well-known laser materials for optically pumped middle-infrared lasers. Cr:ZnSe is a key representative of this class of transition metal doped II-VI gain media and is arguably considered the material of choice for optically pumped middle-infrared lasers. In addition to effective mid-IR lasing under optical excitation, these crystals, being wide-band semiconductors, hold the potential for direct electrical excitation. One way to form n-type conductivity in ZnSe crystals is by annealing them in a melt of Zn-Al alloy. However, this annealing of Cr:ZnSe crystals results in their purification and transfer of chromium to the melt of Zn-Al alloy. In this article, we report on optimizing the doping technique for providing n-type conductivity in Al:Cr:ZnSe crystals while preserving the chromium concentration. Al:Cr:ZnSe samples with resistivities ranging from 10.8 to 992 S-cm were fabricated. While the 2 + valence state of Cr is typically dominant in Cr:ZnSe, both Cr2+ and Cr+ were detected in Al:Cr:ZnSe samples. The maximum level of Cr+ concentration was measured to be 4 x 1018 cm-3.(c) 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
引用
收藏
页码:1497 / 1503
页数:7
相关论文
共 50 条
  • [1] Optical and Electrical Properties of Polycrystalline ZnSe:Li
    G. E. Davydyuk
    V. V. Bulatetskii
    V. S. Manzhara
    O. I. Proskura
    Inorganic Materials, 2002, 38 : 548 - 551
  • [2] Optical and electrical properties of polycrystalline ZnSe:Li
    Davydyuk, GE
    Bulatetskii, VV
    Manzhara, VS
    Proskura, OI
    INORGANIC MATERIALS, 2002, 38 (06) : 548 - 551
  • [3] Optical and EPR spectroscopy of Zn:Cr:ZnSe and Zn:Fe:ZnSe crystals
    Fedorov, V. V.
    Konak, T.
    Dashdorj, J.
    Zvanut, M. E.
    Mirov, S. B.
    OPTICAL MATERIALS, 2014, 37 : 262 - 266
  • [4] Comparison of the optical properties of diffusion-doped polycrystalline Cr:ZnSe and Cr:CdTe windows
    Hömmerich, U
    Jones, IK
    Nyein, EE
    Trivedi, SB
    JOURNAL OF CRYSTAL GROWTH, 2006, 287 (02) : 450 - 453
  • [5] Optical And Electrical Studies Of Al Substituted Cr2O3
    Jangir, Ravindra
    Kumar, Dharmendra
    Bhakar, Ashok
    Yadav, A. K.
    Tokas, R. B.
    Jha, S. N.
    Ganguli, Tapas
    DAE SOLID STATE PHYSICS SYMPOSIUM 2018, 2019, 2115
  • [6] Effects of the Processing Technology of CVD-ZnSe, Cr2+:ZnSe, and Fe2+:ZnSe Polycrystalline Optical Elements on the Damage Threshold Induced by a Repetitively Pulsed Laser at 2.1 μm
    Yudin, Nikolay
    Antipov, Oleg
    Balabanov, Stanislav
    Eranov, Ilya
    Getmanovskiy, Yuri
    Slyunko, Elena
    CERAMICS-SWITZERLAND, 2022, 5 (03): : 459 - 471
  • [7] Size Effect of Electrical and Optical Properties in Cr2+:ZnSe Nanowires
    Zhang, Yuqin
    He, Shi
    Yao, Honghong
    Zuo, Hao
    Liu, Shuang
    Yang, Chao
    Feng, Guoying
    NANOMATERIALS, 2023, 13 (02)
  • [8] OPTICAL ELECTRICAL AND EPR STUDIES OF KBR CRYSTALS DOPED WITH CADMIUM
    JAIN, SC
    RADHAKRISHNA, S
    PHYSICAL REVIEW, 1968, 172 (03): : 972 - +
  • [9] EPR, optical and thermometric studies of Cr3+ions in the α-Al2O3 synthetic
    Ulmane, N. Mironova
    Brik, M. G.
    Grube, J.
    Krieke, G.
    Kemere, M.
    Antuzevics, A.
    Gabrusenoks, E.
    Skvortsova, V.
    Elsts, E.
    Sarakovskis, A.
    Piasecki, M.
    Popov, A. I.
    OPTICAL MATERIALS, 2022, 132
  • [10] Optical properties and electrical properties of heavily Al-doped ZnSe layers
    Oh, D. C.
    Takai, T.
    Im, I. H.
    Park, S. H.
    Hanada, T.
    Yao, T.
    Song, J. S.
    Chang, J. H.
    Makino, H.
    Han, C. S.
    Koo, K. H.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2008, 26 (02): : 259 - 264