Bi-polysilicon passivating contact technique for crystalline silicon solar cell

被引:9
|
作者
Kim, Sungheon [1 ]
Jeong, Sungjin [2 ]
Kim, Hongrae [2 ]
Khokhar, Muhammad Quddamah [2 ]
Dhungel, Suresh Kumar [3 ]
Dao, Vinh-Ai [4 ]
Pham, Duy Phong [2 ]
Kim, Youngkuk [3 ]
Yi, Junsin [3 ]
机构
[1] Sungkyunkwan Univ, Interdisciplinary Program Photovolta Syst Engn, Suwon 16419, South Korea
[2] Sungkyunkwan Univ, Dept Elect & Comp Engn, Suwon 16419, South Korea
[3] Sungkyunkwan Univ, Coll Informat & Commun Engn, Suwon 16419, South Korea
[4] Ho Chi Minh City Univ Technol & Educ, Fac Appl Sci, Dept Phys, Ho Chi Minh 700000, Vietnam
关键词
Polysilicon materials; Tunnelling oxide passivating contact; Crystalline silicon solar cells; Carrier selective contact; TRANSPORT;
D O I
10.1016/j.mssp.2023.107453
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Polysilicon (poly-Si) passivating contacts overcome the direct metal-semiconductor contact drawback of tradi-tional industrial crystalline silicon (c-Si) solar cells by inserting a layer stack of poly-Si and silicon oxide layers at the rear full-area metal/c-Si interface, which is well-known as a tunnel oxide passivating contact (TOPCon). In conventional industrial TOPCon devices, the direct contact problem affects the emitter, which deteriorates the passivation quality and suppresses the open-circuit voltage (Voc). We herein introduce an innovative bi-poly-Si technique (Bi-TOPCon) featuring rear full-area passivated poly-Si and emitter locally passivated poly-Si to improve the passivation quality of the TOPCon device. The local emitter poly-Si is introduced using metal mask alignment, and its properties are optimised toward high passivation quality and low contact resistance. The Bi-TOPCon device shows a significant improvement in Voc (Voc > 700 mV). Bi-TOPCon is a promising technology for high-efficiency, next-generation industrial TOPCon devices.
引用
收藏
页数:8
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