Graphene/Al2O3/Si Schottky diode with integrated waveguide on a silicon-on-insulator wafer

被引:4
|
作者
Seven, E. [1 ,2 ]
Orhan, E. Oz [3 ]
Di Bartolomeo, A. [4 ]
Ertugrul, M. [1 ,6 ,7 ]
Tastekin, N. Avishan [5 ]
机构
[1] Ataturk Univ, Dept Nanosci & Nanoengn, TR-25100 Erzurum, Turkiye
[2] Yuksek Ihtisas Univ, Med Lab Tech, TR-06800 Ankara, Turkiye
[3] Gazi Univ, Dept Phys, TR-06500 Ankara, Turkiye
[4] Univ Salerno, Dept Phys ER Caianiello, I-84084 Fisciano, Salerno, Italy
[5] Middle East Tech Univ, Micro & Nanotechnol Program, TR-06800 Ankara, Turkiye
[6] Karadeniz Tech Univ, Fac Engn Met & Mat Engn, TR-61040 Trabzon, Turkiye
[7] Univ Putra Malaysia, Inst Nanosci & Nanotechnol ION2, Serdang 43400, Selangor, Malaysia
关键词
Silicon-on-insulator (SOI); Schottky barrier; Graphene; Waveguide; Series resistance; Ideality factor; BARRIER HEIGHT; GRAPHENE; INHOMOGENEITY; EFFICIENCY; OXIDE;
D O I
10.1007/s12648-023-03062-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Waveguide-integrated graphene photodiodes are on-chip optoelectronic devices with promising applications in telecommunications. Here, we present the electrical properties of a heterostructure consisting of multilayer graphene (MLGr) over a Si waveguide covered by an ultrathin Al2O3 layer. The waveguide is fabricated by etching a silicon-on insulator (SOI) substrate with 220 nm Si and 1.5 lm buried oxide. The 5 nm-thick Al2O3 film is deposited by atomic layer deposition (ALD), while graphene, synthesized on copper by chemical vapor deposition (CVD), is transferred onto the Al2O3/Si rib by a wet transfer method. The MLGr/ Al2O3 /Si rib forms a Schottky structure with rectifying current-voltage characteristics, which are examined using the thermionic emission theory and Norde's method. A Schottky barrier height UB = 0.79eV, an ideality factor n = 26, and a series resistance R-S = 11.6MX are obtained. The device is promising for operation at the optical fiber communication wavelength of 1550 nm.
引用
收藏
页码:2795 / 2803
页数:9
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