High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk chromium

被引:1
|
作者
Zborowski, C. [1 ,2 ]
Vanleenhove, A. [1 ]
Hoflijk, I. [1 ]
Vaesen, I. [1 ]
Artyushkova, K. [3 ]
Conard, T. [1 ]
机构
[1] Imec, MCACSA, Kapeldreef 75, B-3001 Leuven, Belgium
[2] Katholieke Univ Leuven, Inst Kernen Stralingsfys, Celestijnenlaan 200D, B-3001 Leuven, Belgium
[3] Phys Elect, 18725 Lake Dr East, Chanhassen, MN 55317 USA
来源
SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 02期
关键词
chromium; HAXPES; Cr K-& alpha; Cr;
D O I
10.1116/6.0002770
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Chromium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of chromium obtained using monochromatic Cr K-a radiation at 5414.8 eV include survey scan and high-resolution spectra of Cr 2s, Cr 2p, Cr 3s, and Cr 3p.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] High-energy x-ray photoelectron spectroscopy spectra of Al2O3 measured by Cr Kα
    Hoflijk, I.
    Zborowski, C.
    Vaesen, I.
    Vanleenhove, A.
    Artyushkova, K.
    Conard, T.
    SURFACE SCIENCE SPECTRA, 2022, 29 (01):
  • [22] X-RAY PHOTOELECTRON SPECTROSCOPY OF CHROMIUM-OXYGEN SYSTEMS
    ALLEN, GC
    CURTIS, MT
    HOOPER, AJ
    TUCKER, PM
    JOURNAL OF THE CHEMICAL SOCIETY-DALTON TRANSACTIONS, 1973, (16): : 1675 - 1683
  • [23] Hard x-ray photoelectron spectroscopy reference spectra of W with Cr Kα excitation
    Zheng, Dong
    Young, Christopher N.
    Stickle, William F.
    SURFACE SCIENCE SPECTRA, 2023, 30 (02):
  • [24] Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination
    Kobata, Masaaki
    Pis, Igor
    Nohira, Hiroshi
    Iwai, Hideo
    Kobayashi, Keisuke
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (13) : 1632 - 1635
  • [25] FLUX MEASUREMENT FOR X-RAY PHOTOELECTRON-SPECTROSCOPY
    WIELICZKA, DM
    WAGNER, E
    WINTERGERST, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (08): : 4387 - 4388
  • [26] X-RAY PHOTOELECTRON-SPECTROSCOPY WITH X-RAY PHOTONS OF HIGHER ENERGY
    WAGNER, CD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 518 - 523
  • [27] Binding energy referencing in X-ray photoelectron spectroscopy
    Greczynski, Grzegorz
    Hultman, Lars
    NATURE REVIEWS MATERIALS, 2025, 10 (01): : 62 - 78
  • [28] Study of poly(ether sulfone) metal interfaces by high energy x-ray photoelectron spectroscopy and x-ray absorption spectroscopy
    Tegen, N
    Morton, SA
    Watts, JF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (03): : 544 - 549
  • [29] X-RAY PHOTOELECTRON SPECTROSCOPY
    HOLLANDER, JM
    JOLLY, WL
    ACCOUNTS OF CHEMICAL RESEARCH, 1970, 3 (06) : 193 - +
  • [30] X-RAY PHOTOELECTRON SPECTROSCOPY
    FRIEDMAN, RM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1972, : 8 - &