Accessing topological feature of polycrystalline microstructure using object detection technique

被引:2
|
作者
Venkatanarayanan, Mridhula [1 ]
Amos, P. G. Kubendran [1 ,2 ]
机构
[1] Natl Inst Technol Tiruchirappalli, Dept Met & Mat Engn, Theoret Met Grp, Tiruchirappalli, Tamil Nadu, India
[2] Karlsruhe Inst Technol KIT, Inst Appl Mat IAM MMS, Str Forum 7, D-76131 Karlsruhe, Germany
关键词
Topological feature; Face class; Polycrystalline microstructure; Object detection; Computer vision; GRAIN-GROWTH; PHASE-FIELD; RECONSTRUCTION; RECALL;
D O I
10.1016/j.mtla.2023.101697
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Faces-classes of grains, often referred to as topological features, largely dictate the evolution of polycrystalline microstructures during grain growth. Realising these topological features is generally an arduous task, often demanding sophisticated techniques. In the present work, a distinct machine-learning algorithm is extended for the first time to comprehend the topological distribution of the grains constituting a polycrystalline continuum. This regression-based object-detection approach, besides significantly reducing human-efforts and ensuring computational efficiency, predicts the face-class of the grains by introducing appropriate 'bounding boxes'. After sufficient training and validation, over 500 epochs, the current model exhibits a remarkable overlap with the ground truth that encompasses manually realised topological features of the polycrystalline microstructures. Accuracy of this treatment is further substantiated by relevant statistical studies including precision-recall analysis. The model is exposed to unknown test dataset and its performance is assessed by comparing its predictions with the labelled microstructures. Reflecting the statistical accuracy, a strong agreement between the algorithm-predictions and the ground truth is noticeable in these comparative studies involving polycrystalline systems with varying number of grains.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] Object Detection In Quantized Feature Space
    Bulla, Christopher
    Luthra, Bhomik
    Qian, Ningqing
    2014 IEEE FOURTH INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS BERLIN (ICCE-BERLIN), 2014, : 391 - 394
  • [42] Feature Enhancement SSD for Object Detection
    Tan H.
    Li S.
    Liu B.
    Liu X.
    Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics, 2019, 31 (04): : 573 - 579
  • [43] Sequential Feature Fusion for Object Detection
    Wang, Qiang
    Han, Yahong
    ADVANCES IN MULTIMEDIA INFORMATION PROCESSING, PT I, 2018, 11164 : 689 - 699
  • [44] On Semantic Object Detection with Salient Feature
    Li, Zhidong
    Chen, Jing
    ADVANCES IN VISUAL COMPUTING, PT II, PROCEEDINGS, 2008, 5359 : 782 - 791
  • [45] Centralized Feature Pyramid for Object Detection
    Quan, Yu
    Zhang, Dong
    Zhang, Liyan
    Tang, Jinhui
    IEEE TRANSACTIONS ON IMAGE PROCESSING, 2023, 32 : 4341 - 4354
  • [46] Robust feature design for object detection
    Hu, Woong
    Koo, Min-Su
    Nam, Jae-Hyun
    Kim, Byung-Gyu
    Kim, Sung-Ki
    Lecture Notes in Electrical Engineering, 2015, 373 : 117 - 123
  • [47] Learning Balance Feature for Object Detection
    Zhang, Zhiqiang
    Qiu, Xin
    Li, Yongzhou
    ELECTRONICS, 2022, 11 (17)
  • [48] Feature Selective Networks for Object Detection
    Zhai, Yao
    Fu, Jingjing
    Lu, Yan
    Li, Houqiang
    2018 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2018, : 4139 - 4147
  • [49] Foreground Feature Enhancement for Object Detection
    Jiang, Shenwang
    Xu, Tingfa
    Li, Jianan
    Shen, Ziyi
    Guo, Jie
    IEEE ACCESS, 2019, 7 : 49223 - 49231
  • [50] Adaptive multiscale feature for object detection
    Yu, Xiaoyong
    Wu, Siyuan
    Lu, Xiaoqiang
    Gao, Guilong
    NEUROCOMPUTING, 2021, 449 : 146 - 158