Effect of phosphorus doping on the luminescence intensity of Si-NC in SiO/Si multilayers

被引:1
|
作者
Luo, Y. [1 ]
Yang, X. [2 ]
Yue, L. [1 ]
Ren, D. S. [1 ]
Chen, J. R. [1 ]
机构
[1] Guizhou Minzu Univ, Sch Mat Sci & Engn, Guiyang 550025, Peoples R China
[2] Qianxi Siyuan Expt Sch, Qianxi 551500, Peoples R China
基金
中国国家自然科学基金;
关键词
SILICON NANOCRYSTALS; QUANTUM DOTS; DOPED SI; NANOSTRUCTURES;
D O I
10.1364/OE.494438
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The application of silicon nanocrystals (Si-NC) is somewhat limited due to their low luminescence intensity. Therefore, it is of interest to investigate methods for enhancing the luminescence intensity of Si-NC. In this study, phosphorus (P)-doped Si-NC with two different doping methods were prepared by electron beam thermal evaporation: in-situ doping (during synthesis) and ex-situ doping (after synthesis). The photoluminescence (PL) intensity and crystallinity of Si-NC can be enhanced through phosphorus doping. Moreover, a comparison between two different methods of Si-NC doping reveals that the luminescence intensity of in-situ P-doped Si-NC is superior to that of ex-situ P-doped Si-NC, which is increased by an order of magnitude compared to the PL intensity of undoped Si-NC.
引用
收藏
页码:24566 / 24572
页数:7
相关论文
共 50 条
  • [21] Resonant tunnelling in nc-Si/SiO2 multilayers at room temperature
    Chen Deyuan
    JOURNAL OF SEMICONDUCTORS, 2011, 32 (08)
  • [22] The origin of blue photoluminescence from nc-Si/SiO2 multilayers
    马忠元
    郭四华
    陈德媛
    魏德远
    姚瑶
    周江
    黄锐
    李伟
    徐骏
    徐岭
    黄信凡
    陈坤基
    冯端
    Chinese Physics B, 2008, 17 (01) : 303 - 306
  • [23] The origin of blue photoluminescence from nc-Si/SiO2 multilayers
    Ma Zhong-Yuan
    Guo Si-Hua
    Chen De-Yuan
    Wei De-Yuan
    Yao Yao
    Zhou Jiang
    Huang Rui
    Li Wei
    Xu Jun
    Xu Ling
    Huang Xin-Fan
    Chen Kun-Ji
    Feng Duan
    CHINESE PHYSICS B, 2008, 17 (01) : 303 - 306
  • [24] Resonant tunnelling in nc-Si/SiO2 multilayers at room temperature
    陈德媛
    Journal of Semiconductors, 2011, 32 (08) : 23 - 26
  • [25] Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy
    Stenger, I.
    Gallas, B.
    Siozade, L.
    Fisson, S.
    Vuye, G.
    Chenot, S.
    Rivory, J.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2007, 38 (1-2): : 176 - 180
  • [26] Whispering gallery modes at 800 nm and 1550 nm in concentric Si-nc/Er:SiO2 microdisks
    Marchena, Elton
    Redding, Brandon
    Creazzo, Tim
    Shi, Shouyuan
    Prather, Dennis W.
    JOURNAL OF NANOPHOTONICS, 2010, 4
  • [27] Correlation between light emissions from amorphous-Si:H/SiO2 and nc-Si/SiO2 multilayers
    Ma Zhong-Yuan
    Han Pei-Gao
    Li Wei
    Chen De-Yuan
    Wei De-Yuan
    Qian Bo
    Li Wei
    Xu Jun
    Xu Ling
    Huang Xin-Fan
    Chen Kun-Ji
    Feng Duan
    CHINESE PHYSICS LETTERS, 2007, 24 (07) : 2064 - 2067
  • [28] Modulation of the photoluminescence spectrum by depth selective excitation of an embedded Si-nc layer
    Smirani, R
    Martin, F
    Abel, G
    Wang, YQ
    Ross, GG
    NANOTECHNOLOGY, 2005, 16 (01) : 32 - 36
  • [29] Morphological, compositional, structural, and optical properties of Si-nc embedded in SiOx films
    J Alberto Luna López
    J Carrillo López
    D E Vázquez Valerdi
    G García Salgado
    T Díaz-Becerril
    A Ponce Pedraza
    F J Flores Gracia
    Nanoscale Research Letters, 7
  • [30] Optical and structural properties of SiO2 co-doped with Si-nc and Er3+ ions
    Cueff, Sebastien
    Labbe, Christophe
    Dierre, Benjamin
    Cardin, Julien
    Khomenkova, Larysa
    Fabbri, Filippo
    Sekiguchi, Takashi
    Rizk, Richard
    NANOSTRUCTURED THIN FILMS III, 2010, 7766