Effect of phosphorus doping on the luminescence intensity of Si-NC in SiO/Si multilayers

被引:1
|
作者
Luo, Y. [1 ]
Yang, X. [2 ]
Yue, L. [1 ]
Ren, D. S. [1 ]
Chen, J. R. [1 ]
机构
[1] Guizhou Minzu Univ, Sch Mat Sci & Engn, Guiyang 550025, Peoples R China
[2] Qianxi Siyuan Expt Sch, Qianxi 551500, Peoples R China
基金
中国国家自然科学基金;
关键词
SILICON NANOCRYSTALS; QUANTUM DOTS; DOPED SI; NANOSTRUCTURES;
D O I
10.1364/OE.494438
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The application of silicon nanocrystals (Si-NC) is somewhat limited due to their low luminescence intensity. Therefore, it is of interest to investigate methods for enhancing the luminescence intensity of Si-NC. In this study, phosphorus (P)-doped Si-NC with two different doping methods were prepared by electron beam thermal evaporation: in-situ doping (during synthesis) and ex-situ doping (after synthesis). The photoluminescence (PL) intensity and crystallinity of Si-NC can be enhanced through phosphorus doping. Moreover, a comparison between two different methods of Si-NC doping reveals that the luminescence intensity of in-situ P-doped Si-NC is superior to that of ex-situ P-doped Si-NC, which is increased by an order of magnitude compared to the PL intensity of undoped Si-NC.
引用
收藏
页码:24566 / 24572
页数:7
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