Water-assisted mass preparation of CsPbBr3-CsPb2Br5-CsPbIxBr3-x composite wafers for high-performance X-ray detection

被引:7
|
作者
Ba, Yanshuang [1 ,2 ]
Han, Yaoyu [1 ,2 ]
Zhu, Weidong [1 ,2 ,3 ]
Wang, Tianran [1 ,2 ]
Chi, Jiawei [1 ,2 ]
Xi, He [1 ,2 ,4 ]
Zhao, Tianlong [1 ,2 ]
Chen, Dazheng [1 ,2 ,3 ]
Zhang, Jincheng [1 ,2 ]
Zhang, Chunfu [1 ,2 ,3 ]
Hao, Yue [1 ,2 ]
机构
[1] Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Band Gap Semicond Te, Xian 710071, Peoples R China
[2] Xidian Univ, Sch Microelect, Shaanxi Joint Key Lab Graphene, Xian 710071, Peoples R China
[3] Xidian Univ, Guangzhou Inst Technol, Guangzhou Wide Bandgap Semicond Innovat Ctr, Guangzhou 510555, Peoples R China
[4] Xidian Univ, Sch Adv Mat & Nanotechnol, Xian 710126, Peoples R China
基金
中国国家自然科学基金;
关键词
All-inorganic perovskite; Pressure-induced aggregation; Spray coating; Composite wafer; X-ray detector; LARGE-AREA; SENSITIVITY; CDZNTE;
D O I
10.1016/j.cej.2023.147726
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Lead halide perovskite wafers with large lateral size, controllable thickness, and desirable optoelectronic char-acteristics are promising for X-ray detectors. Herein, CsPbBr3-CsPb2Br5-CsPbIxBr3-x composite wafers are pre-pared via water-assisted coprecipitation and spray coating. The preparation involved pressure-induced aggregation of the CsPbBr3-CsPb2Br5 powder produced through coprecipitation using of H2O/MeOH mixed solvent into CsPbBr3-CsPb2Br5 wafers, followed by spraying a CsI/H2O solution onto the wafer surface to transform it into a CsPbBr3-CsPb2Br5-CsPbIxBr3-x composite wafer. Multiple favorable properties, including compact surface, high crystallinity, excellent carrier transportation, large/adjustable size, low cost, and mass producibility, can be identified for the CsPbBr3-CsPb2Br5-CsPbIxBr3-x composite wafer. An X-ray detector with high performance and excellent stability is realized with this wafer. It yields high resistivity (p; 1.3 x 109 omega cm-2, exceptional carrier mobility (mu)/lifetime (r) (mu r) product (1.01 x 10-3 cm2 V-1), high sensitivity (20555.1 mu C Gyair -1 cm-2), and low detection limit (127.7 nGy s-1). Hence, our research provides a reliable strategy for optimizing the structure and performance of perovskite wafer-based X-ray detectors and enabling mass preparation.
引用
收藏
页数:9
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