Influence of Sm3+ doped β-Ga2O3 thin films on structural, optical, and photoluminescence properties

被引:2
|
作者
Kumar, M. Dilip [1 ]
Akkera, Harish Sharma [2 ]
Kambhala, Nagaiah [3 ]
Kagola, Upendra Kumar [4 ]
Ramesh, C. S. [5 ]
Kumar, K. Vijaya [6 ]
机构
[1] Presidency Univ, Sch Engn, Dept Phys, Bangalore 560064, Karnataka, India
[2] BMS Inst Technol & Management, Dept Phys, Bangalore 560064, Karnataka, India
[3] Jain Deemed Be Univ, Sch Sci, Dept Phys, Bangalore 560011, Karnataka, India
[4] REVA Univ, Sch Appl Sci, Dept Phys, Bangalore 560064, Karnataka, India
[5] Presidency Univ, Dept Mech Engn, Bangalore 560064, Karnataka, India
[6] Dayananda Sagar Univ, Sch Engn, Dept Phys, Bangalore 562112, Karnataka, India
关键词
BAND-GAP; PERFORMANCE; TRANSITION; MORPHOLOGY; GROWTH;
D O I
10.1007/s10854-023-11505-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The pure and Sm-doped (1, 3, and 5 at%) beta-Ga2O3 thin films were deposited on a glass substrate using the sol-gel spin coating method and investigated the structural, morphological, and optical properties. The XRD studies revealed that all deposited thin films exhibited polycrystalline monoclinic beta-phase structure. The crystalline quality was greatly improved with the Sm-doping. The SEM-EDS, XPS, and Raman spectroscopy measurements confirmed the Sm element was successfully incorporated into the beta-Ga2O3 host lattice. The photoluminescence spectra showed a wide blue band region centered at 439 nm in all the films. The average optical transmittance was above 73% in the visible spectra for all deposited films. The optical band gap energy (E-g) decreased from 4.83 eV for pure beta-Ga2O3) film to 4.68 eV for 5 at% Sm-doped beta-Ga2O3 films.
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页数:9
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