Combinatorial testing and machine learning for automated test generation

被引：0
|
作者：
Le Traon, Yves [1 ]
Xie, Tao [2 ]
机构：
[1] Univ Luxembourg, Interdisciplinary Ctr Secur Reliabil & Trust, Esch Sur Alzette, Luxembourg
[2] Peking Univ, Sch Comp Sci, Beijing, Peoples R China
来源：
SOFTWARE TESTING VERIFICATION & RELIABILITY | 2023年 / 33卷 / 04期
关键词：
D O I：
10.1002/stvr.1846
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页数：1
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