HAXPES reference spectra of Ir with Cr Ka excitation

被引：1
|
作者：
Zheng, Dong [1 ]
Young, Christopher N. N. [2 ]
Stickle, William F. F. [2 ]
机构：
[1] HP Singapore Private Ltd, Adv Mat & Test Ctr, Singapore City, Singapore
[2] HP Inc, Analyt & Dev Labs, Corvallis, OR 97330 USA
来源：
SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 01期
关键词：
HAXPES; Auger; Ir; Cr K-alpha;
D O I：
10.1116/6.0002370
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Monochromatic Cr K-alpha radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Ir sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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页数：11
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