Bending of PN junctions in flexoelectric semiconductors

被引:2
|
作者
Wei, Chao [1 ,2 ]
Tang, Jian [1 ,2 ]
Huang, Wenbin [1 ,2 ]
机构
[1] Chongqing Univ, State Key Lab Mech Transmiss, Chongqing 400044, Peoples R China
[2] Chongqing Univ, Coll Mech & Vehicle Engn, Chongqing 400044, Peoples R China
来源
ENGINEERING RESEARCH EXPRESS | 2023年 / 5卷 / 03期
基金
中国国家自然科学基金;
关键词
flexoelectric; semiconductors; PN junction; bending deformation; INDUCED POTENTIAL BARRIERS; EXTENSION; FIBER;
D O I
10.1088/2631-8695/acf18b
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, electromechanical fields and carrier distributions in a PN junction with coupling to bending deformation are investigated. Based on the macroscopic theory of flexoelectricity and the semiconductor drift-diffusion theory, a one-dimensional model of the PN junction is developed. The effects of doping level, flexoelectric coefficient and material constants on electrons and holes at the equilibrium state are analyzed. The I-V characteristic of the PN junction under the bias voltage is also obtained. The flexoelectric field is demonstrated to affect the built-in electric field of the PN junction and the carrier distributions in the p-doped and n-doped regions, suggesting an avenue for performance tuning of PN junctions.
引用
收藏
页数:15
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