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Single-Pixel Imaging in Space and Time with Optically Modulated Free Electrons
被引:4
|作者:
Konecna, Andrea
[1
,4
]
Rotunno, Enzo
[5
]
Grillo, Vincenzo
[5
]
de Abajo, F. Javier Garcia
[1
,2
]
Vanacore, Giovanni Maria
[3
]
机构:
[1] Barcelona Inst Sci & Technol, ICFO Inst Ciencies Foton, Barcelona 08860, Spain
[2] ICREA Inst Catalana Recerca & Estudis Avancats, Barcelona 08010, Spain
[3] Univ Milano Bicocca, Dept Mat Sci, Lab Ultrafast Microscopy Nanoscale Dynam LUMiNaD, I-20121 Milan, Italy
[4] Brno Univ Technol, Cent European Inst Technol, Brno 61200, Czech Republic
[5] CNR, Ist Nanosci, Ctr S3, I-41125 Modena, Italy
基金:
欧洲研究理事会;
关键词:
single -pixel imaging;
electron microscopy;
electron beam shaping;
electron;
light interaction;
ultrafast dynamics;
PHASE PLATE;
RECONSTRUCTION;
D O I:
10.1021/acsphotonics.3c00047
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Single-pixel imaging, originally developed in light well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial resolution of optics-based single-pixel microscopy is limited by diffraction to hundreds of nanometers. Here, we propose an implementation of single-pixel imaging relying on attainable modifications of currently available ultrafast electron microscopes in which optically modulated electrons are used instead of photons to achieve subnanometer spatially and temporally resolved single-pixel imaging. We simulate electron beam profiles generated by interaction with the optical field produced by an externally programmable spatial light modulator and demonstrate the feasibility of the method by showing that the sample image and its temporal evolution can be reconstructed using realistic imperfect illumination patterns. Electron single-pixel imaging holds strong potential for application in low-dose probing of beam-sensitive biological and molecular samples, including rapid screening during in situ experiments.
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页码:1463 / 1472
页数:10
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