Spectral Test Generation for Boolean Expressions

被引:0
|
作者
Ayav, Tolga [1 ]
机构
[1] Izmir Inst Technol, Dept Comp Engn, TR-35430 Izmir, Turkiye
关键词
Boolean expressions; formal methods; Fourier analysis; software testing;
D O I
10.1142/S021819402350033X
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper presents a novel method for testing Boolean expressions. It is based on spectral, aka Fourier analysis of Boolean functions which is exploited to generate test inputs. The approach has three important contributions: (i) It generates a relatively small test suite with a high capability of fault detection, (ii) The test suite is prioritized such that expected fault detection time is shorter, (iii) It is entirely mathematical relying on a simple and straightforward formula. The proposed method is formulated and evaluations are performed on both synthetic and real expressions. It is also compared with two common test generation criteria, MC/DC and Minimal MUMCUT. Evaluations show that the test suite generated by the spectral approach is relatively small while expressing the capability of a better and quicker fault detection. The approach presented in this paper provides a useful insight into how spectral/Fourier analysis of Boolean functions can be exploited in software testing.
引用
收藏
页码:1239 / 1260
页数:22
相关论文
共 50 条
  • [21] COMPUTER EXPANSION OF BOOLEAN EXPRESSIONS
    CHUANG, YH
    COMPUTER, 1971, 4 (03) : 23 - &
  • [22] On detecting faults for Boolean expressions
    T. Y. Chen
    M. F. Lau
    K. Y. Sim
    C. A. Sun
    Software Quality Journal, 2009, 17 : 245 - 261
  • [23] Programming Boolean expressions for testability
    White, AL
    2004 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-6, 2004, : 3110 - 3122
  • [24] PROGRAM SIMPLIFIES BOOLEAN EXPRESSIONS
    DAI, JK
    EDN, 1990, 35 (09) : 238 - &
  • [25] Test case generation with regular expressions and combinatorial techniques
    Polo Usaola, Macario
    Ruiz Romero, Francisco
    Rodriguez-Bobada Aranda, Rosana
    Garcia Rodriguez, Ignacio
    10TH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS - ICSTW 2017, 2017, : 189 - 198
  • [26] Parallel test generation for combinational circuits based on Boolean satisfiability
    Sun, YZ
    Wei, DZ
    NINTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS, 1996, : 267 - 270
  • [27] Spectral RTL test generation for microprocessors
    Yogi, Nitin
    Agrawal, Vishwani D.
    20TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: TECHNOLOGY CHALLENGES IN THE NANOELECTRONICS ERA, 2007, : 473 - +
  • [28] Test Suite Generation for Boolean Conditions with Equivalence Class Partitioning
    Halle, Sylvain
    IEEE/ACM 10TH INTERNATIONAL CONFERENCE ON FORMAL METHODS IN SOFTWARE ENGINEERING (FORMALISE 2022), 2022, : 23 - 33
  • [29] Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
    Gebregiorgis, Anteneh
    Tahoori, Mehdi B.
    2019 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2019, : 1028 - 1033
  • [30] Test generation algorithm for sequential circuit based on Boolean function
    Liang, YY
    Huang, YH
    Cao, HB
    Cai, JY
    ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS, 2001, : 63 - 66