Influence of CaZrO3 on dielectric properties and microstructures of BaTiO3-based X8R ceramics

The influences of CaZrO3 on the dielectric properties and microstructures of BaTiO3 (BT)-based ceramics have been investigated. The experiment results showed that the dielectric constant at room temperature increased with the addition of CaZrO3 in the range of 0―3.0 mol%, which could be explained by the growth of BT grains. XRD analysis revealed that the tetragonality declined as CaZrO3 concentration in-creased. XRD patterns of BT ceramics with different amounts of CaZrO3 doping were analyzed by a recently developed procedure-materials analysis using diffrac-tion (MAUD), which was based on the Rietveld method combined with Fourier analysis. The results depicted that the high temperature peak of tempera-ture-capacitance characteristics (TCC) was largely dependent on the micro-strain of samples. Furthermore, more CaZrO3 doping resulted in lower porosity and higher density. It was revealed that proper usage of CaZrO3 could improve the di-electric properties significantly, which was benefit to develop X8R multi-layer ce-ramic capacitors.