Influence of scanning force microscope loading force on measurement of ion-track diameter

被引：0
|
作者：
Wang Yu Gang
机构：
来源：
Nuclear Science and Techniques | 1997年 / 03期
关键词：
Ion track diameter; Scanning force microscopy; loading force;
D O I：
暂无
中图分类号：
TL503.3 [注入装置];
学科分类号：
摘要：
ＩｎｆｌｕｅｎｃｅｏｆｓｃａｎｎｉｎｇｆｏｒｃｅｍｉｃｒｏｓｃｏｐｅｌｏａｄｉｎｇｆｏｒｃｅｏｎｍｅａｓｕｒｅｍｅｎｔｏｆｉｏｎｔｒａｃｋｄｉａｍｅｔｅｒＷａｎｇＹｕＧａｎｇ，ＺｈａｏＷｅｉＪｉａｎｇ（ＩｎｓｔｉｔｕｔｅｏｆＨｅａｖｙＩｏｎＰ...
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页码：32 / 34
页数：3
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