Failure Mechanism of Reflow Conductor Roll of Electroplating Tinning Line

被引:0
|
作者
FU Han-guang1
2. School of Information Technology and Management Engineering
3. Cold Rolling Plant
机构
关键词
reflow conductor roll; adhered tin; wear; failure;
D O I
10.13228/j.boyuan.issn1006-706x.2006.02.009
中图分类号
TG174.441 [];
学科分类号
080503 ;
摘要
The surface roughness of reflow conductor roll was checked on membrane sample. The surface morphology of conductor roll was observed by microscope, and the composition of adhered layer on conductor roll surface was analyzed by X-ray spectroscope. The results show that tin adhesion is the main reason for failure of conductor roll, and the failure of conductor roll is accelerated by wear. The measures to decrease tin adhesion and improve wear resistance were put forward.
引用
收藏
页码:33 / 36
页数:4
相关论文
共 50 条
  • [21] Failure mechanism and improvement of TFT-LCD Line Zara defect
    Wang Huan
    Yu Xiang
    Zhu Feng-zhi
    Su Yan-xin
    Shen Wu-lin
    Yu Xin-bo
    Liu Xu
    CHINESE JOURNAL OF LIQUID CRYSTALS AND DISPLAYS, 2019, 34 (06) : 549 - 555
  • [22] Failure mechanism and consolidation of the compensation bellows of the LHC cryogenic distribution line
    Brodzinski, K.
    Cruikshank, P.
    Fournel, J. L.
    Tavian, L.
    Veillet, N.
    PROCEEDINGS OF THE 25TH INTERNATIONAL CRYOGENIC ENGINEERING CONFERENCE AND INTERNATIONAL CRYOGENIC MATERIALS CONFERENCE 2014, 2015, 67 : 129 - 134
  • [23] Directional ground relay failure caused by line-to-ground with load-side broken conductor fault
    Brenna, Morris
    Foiadelli, Federica
    Sapienza, Gianluca
    Zaninelli, Dario
    EUROPEAN TRANSACTIONS ON ELECTRICAL POWER, 2012, 22 (07): : 907 - 923
  • [24] Fatigue failure analysis of roll steel pins from a chain assembly: Fracture mechanism and numerical modeling
    Papadopoulou, Sofia
    Pressas, Ioannis
    Vazdirvanidis, Athanasios
    Pantazopoulos, George
    ENGINEERING FAILURE ANALYSIS, 2019, 101 : 320 - 328
  • [25] FURNACE ROLL FAILURE ANALYSIS ON HOT-DIP COATING LINE SPURS NEW DESIGN AND WELDING PROCESS
    Yang, Yu-Ping
    Mohr, William
    ADVANCED MATERIALS & PROCESSES, 2015, 173 (09): : 23 - 25
  • [26] Study on Failure Mechanism of Pressurizer Surge Line and Manhole Structure under LOCA
    Yu H.
    Zhao X.
    Fu S.
    Zhu K.
    Hedongli Gongcheng/Nuclear Power Engineering, 2023, 44 (01): : 109 - 117
  • [27] Investigation of the Trace Line Failure Mechanism and Design of Flexible Wafer Level Packaging
    Yew, Ming-Chih
    Yuan, Cadmus C. A.
    Wu, Chung-Jung
    Hu, Dyi-Chung
    Yang, Wen-Kun
    Chiang, Kuo-Ning
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2009, 32 (02): : 390 - 398
  • [28] Line-spike induced failure mechanism in integrated circuit bond-wires
    Kim, Seokjin
    Choi, Kwangsik
    Peckerar, Martin
    Christou, Aris
    2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL, 2008, : 647 - +
  • [29] Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination
    Jeong, Jae-Seong
    Kim, Young Jeon
    MICROELECTRONICS RELIABILITY, 2010, 50 (9-11) : 1488 - 1493
  • [30] Numerical Model for Understanding Failure Mechanism of Back End of Line (BEOL) in Bump Shear
    Wang, Wei
    Zhao, Wei
    Nakamoto, Mark
    Schwarz, Mark
    He, Dongming
    Zhang, Xuefeng
    Zhao, Lily
    Syed, Ahmer
    2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020), 2020, : 229 - 235