Easy Test Generation PLAs

被引：0
|
作者：
闵应骅 [1 ]
机构：
[1] Chinese Academy of Railway Sciences
来源：
JournalofComputerScienceandTechnology | 1987年 / 01期
关键词：
test; ETG; Test;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Test Generation for large circuits may be extremely difficult.One of the approaches to alleviatingthis problem is to consider the difficulties during the design cycle.This paper proposes a design of EasyTest Generation Programmable Logic Arrays(ETG PLAs),for which test generation is basically notrequired,since a complete test set can be generated while the test is applied.This paper also presents aprocedure which makes a PLA an ETG PLA by following some design rules and providing reasonableextra hardware.
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页码：72 / 80
页数：9
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