Atomic Force Microscopy Studies on the Chemical Treatment of Nanocrystalline Porous TiO2 Films

被引：0
|
作者：
Yuan LIN
机构：
来源：
ChineseChemicalLetters | 2002年 / 05期
基金：
中国国家自然科学基金;
关键词：
Nanocrystalline TiO2 films; chemical treatments; AFM topography; local conductivity;
D O I：
暂无
中图分类号：
O614 [金属元素及其化合物];
学科分类号：
070301 ; 081704 ;
摘要：
AFM has been utilized to study the surface topography and the local conductivity of nanocrystalline TiO2 films. Improving the local conductivity by Ti(iso-C3H7O)4 treatment is characterized by quantitative analysis of the simultaneous current image. The mechanism of Ti(iso C3H7O)4 treatment is discussed.
引用
收藏
页码：484 / 486
页数：3
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