Structural study of sputtered nanocrystalline Ti and Zr by X-ray diffraction

被引：0
|
作者：
SHI Wangzhou
机构：
来源：
ChineseScienceBulletin | 1997年 / 22期
关键词：
nanocrystalline Ti and Zr; structure; X-ray diffraction;
D O I：
暂无
中图分类号：
O434.1 [X射线];
学科分类号：
摘要：
Ti and Zr are extensively used as gas absorbent for obtaining ultrahigh vacuum because of their
引用
收藏
页码：1880 / 1883
页数：4
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