Surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams
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周哲海
[1
,2
]
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谭峭峰
[1
]
金国藩
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State Key Laboratory of Precision Measurement Technology and Instruments,Tsinghua UniversityState Key Laboratory of Precision Measurement Technology and Instruments,Tsinghua University
金国藩
[1
]
机构:
[1] State Key Laboratory of Precision Measurement Technology and Instruments,Tsinghua University
[2] Department of Optical Information Science and Technology,Beijing Information Science and Technology University
Surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams;
exp;
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O436.3 [偏振与色散];
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摘要:
We numerically study the surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams (ASPBs) based on the vectorial diffraction theory. The definition of ASPBs is stated, and the optical setup for surface plasmon polariton (SPP) excitation and mathematical expressions for interfering SPP fields are proposed. The simulation results show that the interfering SPP fields present a multi-focal spot pattern. In addition, the number of spots is related to the polarization order of the incident beams P as 2×(P-1), indicating potential utilization in near-field multiple optical trapping and near-field imaging and sensing. The unique interfering phenomenon is also explained.
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Alferov Univ, Dept Phys & Technol Nanoheterostruct, St Petersburg 194021, Russia
Peter Great St Petersburg Polytech Univ, Lab Multifunct Glassy Mat, St Petersburg 195251, RussiaAlferov Univ, Dept Phys & Technol Nanoheterostruct, St Petersburg 194021, Russia
Scherbak, S. A.
Lipovskii, A. A.
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Alferov Univ, Dept Phys & Technol Nanoheterostruct, St Petersburg 194021, Russia
Peter Great St Petersburg Polytech Univ, Lab Multifunct Glassy Mat, St Petersburg 195251, RussiaAlferov Univ, Dept Phys & Technol Nanoheterostruct, St Petersburg 194021, Russia
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Univ Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Tampere Univ, Phys Unit, Photon Lab, POB 692, FI-33014 Tampere, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Zang, Xiaorun
Bautista, Godofredo
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Tampere Univ, Phys Unit, Photon Lab, POB 692, FI-33014 Tampere, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Bautista, Godofredo
Turquet, Leo
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Tampere Univ, Phys Unit, Photon Lab, POB 692, FI-33014 Tampere, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Turquet, Leo
Setala, Tero
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Univ Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Setala, Tero
Kauranen, Martti
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Tampere Univ, Phys Unit, Photon Lab, POB 692, FI-33014 Tampere, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland
Kauranen, Martti
Turunen, Jari
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Univ Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, FinlandUniv Eastern Finland, Inst Photon, POB 111, FI-80101 Joensuu, Finland