Constant-Step Stress Accelerated Life Test of VFD under Logarithmic Normal Distribution Case

被引：6

作者：

张建平 ^{[1
]}

谢秀中 ^{[2
]}

赵科仁 ^{[2
]}

机构：

[1] School of Computer and Information Eng.,Shanghai Univ. of Electric Power,Shanghai 200090,China

[2] Zhejiang BOE Display Technology Co.Ltd,Shaoxing 312000

来源：

JournalofShanghaiJiaotongUniversity(Science) | 2006年 / 01期

关键词：

vacuum fluorescent display; accelerated life test; logarithmic normal distribution;

D O I：

暂无

中图分类号：

TN141 [显示器件];

学科分类号：

080901 ;

摘要：

In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature increased. Statistical analysis was done by applying logarithmic normal distribution for describing the life, and least square method (LSM) for estimating logarithmic normal parameters. Self-designed special software was used to predict the VFD life. It is verified by numerical results that the VFD life follows logarithmic normal distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. The accurate calculation of the key parameters enables the rapid estimation of VFD life.

引用

页码：14 / 17

页数：4

共 50 条

[41] Influence study of Weibull distribution parameter on double stress down-step accelerated life test
Liang, Qingwei
Wang, Dongdong
INDIAN JOURNAL OF GEO-MARINE SCIENCES, 2018, 47 (01) : 46 - 52
[42] ANALYSIS OF SIMPLE STEP-STRESS ACCELERATED LIFE TEST DATA FROM LINDLEY DISTRIBUTION UNDER TYPE-I CENSORING
Varghese, Sharon A.
Vaidyanathan, V. S.
STATISTICA, 2016, 76 (03) : 233 - 248
[43] Estimation in constant-stress accelerated life tests for extension of the exponential distribution under progressive censoring
El-Din M.M.M.
Abu-Youssef S.E.
Ali N.S.A.
El-Raheem A.M.A.
METRON, 2016, 74 (2) : 253 - 273
[44] Inference for exponentiated Weibull distribution under constant stress partially accelerated life tests with multiple censored
Nassr, Said G.
Elharoun, Neema M.
COMMUNICATIONS FOR STATISTICAL APPLICATIONS AND METHODS, 2019, 26 (02) : 131 - 148
[45] Bayesian Planning of Optimal Step-Stress Accelerated Life Test
Yuan, Tao
Liu, Xi
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2011 PROCEEDINGS, 2011,
[46] Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution
Balakrishnan, Narayanaswamy
Ling, Man Ho
IEEE TRANSACTIONS ON RELIABILITY, 2014, 63 (04) : 944 - 952
[47] Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test
Fathi, Abdullah
Farghal, Al-Wageh A.
Soliman, Ahmed A.
STATISTICAL PAPERS, 2024, 65 (08) : 5021 - 5053
[48] Statistical Analysis for Constant-Stress Accelerated Life Test With Weibull Distribution Under Adaptive Type-II Hybrid Censored Data
Cui, Wei
Yan, Zaizai
Peng, Xiuyun
IEEE ACCESS, 2019, 7 : 165336 - 165344
[49] RELIABILITY STATISTICAL ANALYSIS OF TWO-PARAMETER EXPONENTIAL DISTRIBUTION UNDER CONSTANT STRESS ACCELERATED LIFE TEST WITH INVERSE POWER LAW MODEL
Wang, Ronghua
Gu, Beiqing
Xu, Xiaoling
JOURNAL OF APPLIED ANALYSIS AND COMPUTATION, 2024, 14 (05): : 2993 - 3006
[50] Estimations in a Constant-Stress Partially Accelerated Life Test for Generalized Rayleigh Distribution under Type-II Hybrid Censoring Scheme
Rabie, Abdalla
Hussam, Eslam
Muse, Abdisalam Hassan
Aldallal, Ramy Abdelhamid
Alharthi, Amirah Saeed
Aljohani, Hassan M.
JOURNAL OF MATHEMATICS, 2022, 2022

← 1 2 3 4 5 →