DEFORMATION MEASUREMENT USING DUAL-FREQUENCY PROJECTION GRATING PHASE-SHIFT PROFILOMETRY

被引:0
|
作者
Yanming Chen Yuming He Eryi Hu Hongmao Zhu (Department of Mechanics
机构
基金
中国国家自然科学基金;
关键词
dual-frequency phase-shift profilometry; projection grating; phase unwrapping; deformation;
D O I
暂无
中图分类号
O439 [应用光学];
学科分类号
摘要
2π phase ambiguity problem is very important in phase measurement when a de- formed object has a large out of plane displacement.The dual-frequency projection grating phase- shifting profilometry (PSP) can be used to solve such an issue.In the measurement,two proper- chosen frequency gratings are utilized to synthesize an equivalent wavelength grating which ensures the computed phase in a principal phase range.Thus,the error caused by the phase unwrapping process with the conventional phase reconstruct algorithm can be eliminated.Finally,experimen- tal result of a specimen with large plastic deformation is given to prove that the proposed method is effective to handle the phase discontinuity.
引用
收藏
页码:110 / 115
页数:6
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