THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF-LINEAR CIRCUITS

被引：0
|
作者：
吴耀
童诗白
机构：
[1] Beijing
[2] Department of Automation Tsinghua University
来源：
Journal of Electronics(China) | 1990年 / 03期
基金：
美国国家科学基金会;
关键词：
Analog circuit; Fault diagnosis; K-fault diagnosis; Testability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In view of K-fault testability,the topological construction of a practical circuitis far from ideal.In order to improve the testability of a circuit,we may increase the numberof accessible nodes or use the multi-excitation method.Effectiveness of these methods and thefeasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitationtestability are presented.
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页码：207 / 214
页数：8
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