Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

被引：2
|
作者：
杨远洪
于洪涛
机构：
[1] Beijing 100083
[2] The Institute of Optoelectronics Technology Beijing University of Aeronautics & Astronautics
来源：
ChineseOpticsLetters | 2004年 / 11期
关键词：
FOG;
D O I：
暂无
中图分类号：
O4-34 [物理测量];
学科分类号：
0702 ;
摘要：
A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.
引用
收藏
页码：640 / 642
页数：3
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