Coherent Electric Field Detection Methodology for Phase-Corrected Electro-Optic Sampling

A numerical model is developed to investigate electro-optic (EO) sampling, with the strength of the model residing in its ability to record spectral content when incorporating a phase-correction element. The developed model evaluates the frequency-dependent phase differences arising between the probe and generated electric fields within the EO crystal and subsequently permits these phase differences to be corrected via the optical phase-correction element. To demonstrate the impact of the noted phase differences on the EO process, the numerical approach is used to assess the representative example of a ZnGeP2 EO crystal in the presence and absence of a ZnGeP2 phase-correction crystal. This comprehensive numerical EO sampling model is expected to prompt the investigation of crystals novel to EO sampling.