A novel short-wavelength near-infrared certified reference material from dysprosium and ytterbium oxides

被引:0
|
作者
Lei, Jiang [1 ]
Ming, Luo [1 ]
Wei, Shi [1 ]
机构
[1] Shanghai Inst Measurement & Testing Technol, Shanghai 201203, Peoples R China
来源
JOURNAL OF CHEMICAL METROLOGY | 2024年 / 18卷 / 02期
关键词
Short-wavelength near-infrared; argon emission lines; wavelength calibration; rare earth elements; standard material; HOLMIUM OXIDE; CALIBRATION;
D O I
10.25135/jcm.116.2409-3333
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This study involves the characterization of a new shortwave NIR wavelength standard solution to address the current limitations of shortwave near infrared (NIR) standard materials and to expand the spectral wavelength range of standard materials. Herein, an innovative use of a solution of dysprosium oxide and ytterbium oxide compounds dissolved in perchloric acid solution to calibrate and verify the NIR wavelength of a high-sensitivity ultraviolet-visible-near infrared spectrophotometer is reported. This standard material enables the near infrared wavelength to be accurately traced to the theoretical emission wavelength of the elements. In the study, cubic spline interpolation was performed on the SI traceable and validated instrument for the determination of peak wavelengths. The wavelength standard values of this standard material cover the shortwave near infrared region (700 similar to 1200 nm) with an uncertainty of 0.12 nm at a 95% confidence interval.
引用
收藏
页码:173 / 184
页数:12
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