THz based non-destructive testing system for Security and Inspection Applications

被引:0
|
作者
Sobczyk, Artur [1 ]
Sypek, Maciej [1 ]
Ducin, Izabela [1 ]
Wisniewski, Piotr [2 ]
Kowalczyk, Adam [1 ]
机构
[1] Warsaw Univ Technol, Fac Phys, Koszykowa 75, PL-00662 Warsaw, Poland
[2] Warsaw Univ Technol, Ctr Adv Mat & Technol CEZAMAT, Poleczki 19, PL-02822 Warsaw, Poland
关键词
D O I
10.4302/plp.v166i4.1308
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
(THz) technology has garnered significant attention in non-invasive inspection and security applications due to its ability to penetrate common materials like paper, plastics, and fabrics while remaining non-ionizing. This study presents a package THz scanner utilizing a commercially available 292 GHz wave IMPATT source and a custom-designed 3D-printed multifunctional diffractive optical component for beam shaping. The novelty lies in applying the THz source with limited coherence and broadband detector line. Thus, coherent noise can be suppressed. We discuss the system's design, construction, and performance, demonstrating its feasibility as a costeffective and adaptable solution for package inspection.
引用
收藏
页码:87 / 89
页数:3
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