A Comprehensive Analysis of Performance Degradation in Niobium Thin Film Radio-Frequency Cavities

被引:0
|
作者
Bianchi, Antonio [1 ]
机构
[1] INFN Milan, LASA Lab, I-20054 Segrate, Italy
关键词
Niobium; Radio frequency; Degradation; Temperature measurement; Surface resistance; Copper; Magnetic fields; Substrates; Temperature distribution; Energy states; Cavity resonators; radiofrequency; resonance frequency; niobium; superconducting films; SUPERCONDUCTING CAVITIES; SURFACE-RESISTANCE; TECHNOLOGY;
D O I
10.1109/TASC.2024.3518454
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Niobium thin film radio-frequency (RF) cavities have historically shown performance degradation as the RF field progressively increases, posing limitations on their use in particle accelerators where the real-estate gradient has to be maximized. This issue, often referred to as the medium-field Q-slope problem, has not yet been fully understood and is the subject of ongoing research. This study analyzed the RF performance of several niobium thin film cavities reported in the literature. These cavities, with resonance frequencies ranging from 100 MHz to 1.5 GHz, were produced using a variety of coating techniques and manufacturing processes. Despite these notable differences, the field-dependent increase in surface resistance, when normalized by the resonance frequency, is consistently similar across all the niobium thin film cavities analyzed. Consequently, the Q-slope problem might not be strictly influenced by the specific treatments or coating techniques applied. Instead, it appears to be intrinsically associated with the interaction between the RF field and the superconductor, with the frequency of the field playing a significant role.
引用
收藏
页数:5
相关论文
共 50 条
  • [41] DEGRADATION OF ORGANIC FIBERS IN RADIO-FREQUENCY PLASMA
    FINCH, JF
    POULSEN, GG
    PITT, WG
    SAMPE QUARTERLY-SOCIETY FOR THE ADVANCEMENT OF MATERIAL AND PROCESS ENGINEERING, 1992, 23 (02): : 48 - 53
  • [42] Probing Axionlike Particles and the Axiverse with Superconducting Radio-Frequency Cavities
    Bogorad, Zachary
    Hook, Anson
    Kahn, Yonatan
    Soreq, Yotam
    PHYSICAL REVIEW LETTERS, 2019, 123 (02)
  • [43] Laser polishing of niobium for superconducting radio-frequency accelerator applications
    Zhao, Liang
    Klopf, J. Michael
    Reece, Charles E.
    Kelley, Michael J.
    PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 2014, 17 (08):
  • [44] Electromagnetic characterization of superconducting radio-frequency cavities for gw detection
    Ballantini, R
    Bernard, P
    Chincarini, A
    Gemme, G
    Parodi, R
    Picasso, E
    CLASSICAL AND QUANTUM GRAVITY, 2004, 21 (05) : S1241 - S1246
  • [45] CONDUCTIMETRIC ANALYSIS AT RADIO-FREQUENCY
    BLAKE, GG
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (04): : 101 - 102
  • [46] PERFORMANCE DEGRADATION OF PSEUDONOISE CODE LOCK DETECTOR DUE TO RADIO-FREQUENCY INTERFERENCE
    KWON, HM
    IEEE TRANSACTIONS ON COMMUNICATIONS, 1995, 43 (08) : 2305 - 2310
  • [47] Effect of Sn content on the performance of Nb3Sn superconducting radio-frequency cavities
    Pan, Weimin
    Sha, Peng
    He, Feisi
    Mi, Zhenghui
    Liu, Baiqi
    Jin, Song
    Dong, Chao
    Zhai, Jiyuan
    Ye, Lingxi
    Yu, Jinxin
    MATERIALS LETTERS, 2025, 379
  • [48] Degradation and Characterization of Resorbable Phosphate-Based Glass Thin-Film Coatings Applied by Radio-Frequency Magnetron Sputtering
    Stuart, Bryan W.
    Gimeno-Fabra, Miquel
    Segal, Joel
    Ahmed, Ifty
    Grant, David M.
    ACS APPLIED MATERIALS & INTERFACES, 2015, 7 (49) : 27362 - 27372
  • [49] Radio-frequency impedance analysis of anodic tantalum pentoxide thin films
    Dueñas, S
    Castán, H
    Barbolla, J
    Kola, RR
    Sullivan, PA
    ELECTRICALLY BASED MICROSTRUCTURAL CHARACTERIZATION III, 2002, 699 : 185 - 190
  • [50] Electrochemical catalysis of aluminum diboride thin film fabricated by radio-frequency magnetron sputtering
    Nashimoto, Kazuki
    Horiguchi, Yoshiko
    Kumatani, Akichika
    Okada, Takeru
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2024, 63 (04)