Radial Stress Distribution in Micro Dry-Etched Perfluorinated Polymer Optical Fibers

被引:0
|
作者
Nakanishi, Takuto [1 ]
Nakashima, Ryo [1 ]
Ishida, Keito [2 ]
Wada, Yuji [3 ]
Lo, Cheng-Yao [4 ]
Nakamura, Kentaro [3 ]
Lee, Heeyoung [5 ]
Mizuno, Yosuke [6 ]
Yamane, Daisuke [1 ,2 ]
机构
[1] Ritsumeikan Univ, Grad Sch Sci & Engn, Kusatsu, Shiga, Japan
[2] Ritsumeikan Univ, Coll Sci & Engn, Dept Mech Engn, Kusatsu, Shiga, Japan
[3] Tokyo Inst Technol, Inst Innovat Res, Yokohama, Japan
[4] Natl Tsing Hua Univ, Inst Nanoengn & Microsyst, Hsinchu, Taiwan
[5] Shibaura Inst Technol, Grad Sch Engn & Sci, Tokyo, Japan
[6] Yokohama Natl Univ, Fac Engn, Yokohama, Japan
基金
日本科学技术振兴机构;
关键词
perfluorinated polymer optical fibers; dry etching; reactive ion etching; strain sensors;
D O I
10.1002/tee.24257
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the first investigation into how the dry etching depth of the reinforcement layer in perfluorinated polymer optical fibers (PF-POFs) influences radial stress distribution. Using finite element method simulations, we model the PF-POF structure based on the actual dry-etched profiles achieved through reactive ion etching (RIE). The results demonstrate that increasing the etching depth leads to higher radial stress in both the core and cladding layers when strain is applied longitudinally. These findings suggest that RIE processes present a feasible method for tuning the sensitivity of PF-POF-based strain sensors. (c) 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.
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页数:3
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