On the structural study, I-V measurements and observation of Meyer-Neldel rule in Sb additive Se-Te glassy alloys

In the present paper, the samples under investigation Se80-xTe20Sbx (x = 2, 4 and 8) have been prepared by melt-quench procedure. The structural study has been made using x-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive analysis (EDAX). Semiconducting nature of these glasses has been studied by current-voltage (I-V) measurements. dc conductivity measurements, linear and non-linear behaviour and observation of Meyer-Neldel rule have been done at temperature range between 303 K and 333 K in the voltage range upto 200 V. From I-V curves, linear and non-linear behaviour is investigated. It is evident from the analysis that conductivity is increasing with increasing<br /> temperature. It is also established that Meyer- Neldel rule is obeyed by these glasses.