On the structural study, I-V measurements and observation of Meyer-Neldel rule in Sb additive Se-Te glassy alloys

被引：0
|
作者：
Patial, Balbir Singh [1 ]
Kumar, Nitin [1 ]
Kumari, Anita [2 ]
Thakur, Nagesh [1 ]
机构：
[1] Himachal Pradesh Univ Summerhill, Dept Phys, Shimla 171005, HP, India
[2] GGDSD Coll Rajpur Palampur, Dept Chem, Kangra 176067, HP, India
来源：
INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES | 2024年 / 31卷 / 05期
关键词：
Structural; Current Voltage; Meyer-Neldel rule; RELAXATION;
D O I：
10.56042/ijems.v31i5.9435
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In the present paper, the samples under investigation Se80-xTe20Sbx (x = 2, 4 and 8) have been prepared by melt-quench procedure. The structural study has been made using x-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive analysis (EDAX). Semiconducting nature of these glasses has been studied by current-voltage (I-V) measurements. dc conductivity measurements, linear and non-linear behaviour and observation of Meyer-Neldel rule have been done at temperature range between 303 K and 333 K in the voltage range upto 200 V. From I-V curves, linear and non-linear behaviour is investigated. It is evident from the analysis that conductivity is increasing with increasing<br /> temperature. It is also established that Meyer- Neldel rule is obeyed by these glasses.
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收藏
页码：742 / 749
页数：8
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