共 50 条
- [25] Mechanism of temperature-induced plastic deformation of amorphous dielectric films for MEMS applications MEMS 2005 Miami: Technical Digest, 2005, : 471 - 474
- [26] DETERMINATION OF TEMPERATURE-INDUCED DEFORMATION IN MACHINE PARTS BY REFLECTION HOLOGRAPHIC-INTERFEROMETRY DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1986, 39 (10): : 67 - 70
- [28] Atomic structure and high anisotropy of thermal expansion in NiSi single crystals. II. Temperature-induced structural changes Kristallografiya, 2002, 47 (03): : 424 - 428
- [30] Atomic structure and high anisotropy of thermal expansion in NiSi single crystals. II. Temperature-induced structural changes Crystallography Reports, 2002, 47 : 379 - 382