On the characterization of MPA CVD diamond for fracture toughness measurements

被引：0

作者：

Aiello, Gaetano ^{[1
]}

Bonnekoh, Carsten ^{[1
]}

Gabrusenoks, Jevgenijs ^{[2
]}

Gorr, Bronislava ^{[1
]}

Meier, Andreas ^{[1
]}

Popov, Anatoli, I ^{[2
]}

Scherer, Theo ^{[1
]}

Schreck, Sabine ^{[1
]}

Seemann, Klaus ^{[1
]}

Strauss, Dirk ^{[1
]}

Wild, Christoph ^{[3
]}

Woerner, Eckhard ^{[3
]}

机构：

[1] Karlsruhe Inst Technol, Inst Appl Mat, Karlsruhe, Germany

[2] Univ Latvia, Inst Solid State Phys, Riga, Latvia

[3] Diamond Mat GmbH & Co KG, Freiburg, Germany

来源：

2024 49TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, IRMMW-THZ 2024 | 2024年

关键词：

EC systems; CVD diamond; diamond windows; fracture toughness; microfeatures;

D O I：

10.1109/IRMMW-THz60956.2024.10697823

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Failure due to crack propagation is the crucial failure mode of the optical quality polycrystalline diamond disks, which are used as safety and vacuum barriers in the electron cyclotron systems of nuclear fusion devices. This paper reports on the characterization of preliminary polycrystalline diamond samples for experimental measurements of the diamond fracture toughness by the double-torsion method.

引用

页数：2

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