Balancing Current Sharing in Paralleled Silicon Carbide MOSFETs with an Active Compensator

被引:0
|
作者
Rezaeian, A. [1 ]
Afifi, A. [1 ]
Bahrami, H. [1 ]
机构
[1] Malek Ashtar Univ Technol, Fac Elect & Comp Engn, Tehran, Iran
来源
INTERNATIONAL JOURNAL OF ENGINEERING | 2025年 / 38卷 / 06期
关键词
Paralleled MOSFETs; Compensator; Active Gate Driver; Current Sharing; Converters; DEVICE SCREENING STRATEGY; GATE DRIVER;
D O I
10.5829/ije.2025.38.06c.15
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silicon carbide power devices are widely utilized in applications requiring high voltage and current. Due to the limited current capability of a single module, silicon carbide MOSFETs are frequently arranged in parallel to enhance the current capacity of the final product. However, variations in circuit parameters or inconsistencies in semiconductor manufacturing can cause imbalances in the current among the parallel modules, potentially resulting in performance and dependability challenges. To tackle the matter, this paper introduced the use of an active approach designed for paralleled SiC MOSFETs to resolve these unbalanced currents. The proposed method used a current transformer to detect the imbalance current. Further, an active compensator is presented within a closed-loop control feedback that effectively eliminates the current imbalance among parallell modules in a master-slave configuration. Details of current transformer and stability of the closed-loop control are investigated. Experimental results are provided to showcase the viability and efficiency of the proposed approach.
引用
收藏
页码:1421 / 1432
页数:12
相关论文
共 50 条
  • [41] Active Current Balancing for Paralleled SiC Semiconductors in Time-Staggered Switching Mode
    Reiff, David
    Johannliemke, Simon
    Staudt, Volker
    IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2023, 59 (03) : 3639 - 3647
  • [42] Balancing of Peak Currents between Paralleled SiC MOSFETs by Source Impedances
    Mao, Yincan
    Miao, Zichen
    Ngo, Khai D. T.
    Wang, Chi-Ming
    2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC), 2017, : 800 - 803
  • [43] Output Curves Based Hierarchical Clustering Screening Method with Static/Dynamic Current Balancing for Paralleled SiC MOSFETs
    Zheng F.
    Meng H.
    Zhou Z.
    Xu H.
    Luo H.
    Li W.
    CPSS Transactions on Power Electronics and Applications, 2023, 8 (03): : 257 - 268
  • [44] A Dynamic Current Balancing Method for Paralleled SiC MOSFETs With Gate-Branch Full-Coupled Inductors
    Lv, Jianwei
    Yan, Yiyang
    Liu, Jiaxin
    Liu, Baihan
    Zheng, Zexiang
    Chen, Cai
    Kang, Yong
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2024, 39 (10) : 12600 - 12614
  • [45] Research on parallel current sharing Technology of Silicon Carbide MOSFET
    Huo, Ran
    Ma, Huiyuan
    Li, Jiachang
    Ma, Wenbo
    2022 IEEE 6TH ADVANCED INFORMATION TECHNOLOGY, ELECTRONIC AND AUTOMATION CONTROL CONFERENCE (IAEAC), 2022, : 1779 - 1783
  • [46] Effect of common branch impedance coupling and mutual inductance on current sharing of paralleled SiC MOSFETs with different layouts
    Zhao, Bin
    Ke, Junji
    Yu, Qiuping
    Sun, Peng
    Cai, Yumeng
    Zhao, Zhibin
    IET POWER ELECTRONICS, 2022, 15 (01) : 43 - 56
  • [47] Device Screening Strategy for Balancing Short-Circuit Behavior of Paralleling Silicon Carbide MOSFETs
    Ke, Junji
    Zhao, Zhibin
    Zou, Qi
    Peng, Jiaoyang
    Chen, Zhong
    Cui, Xiang
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2019, 19 (04) : 757 - 765
  • [48] A Novel Field-Programmable Gate Array-Based Self-Sustaining Current Balancing Approach for Silicon Carbide MOSFETs
    Giannopoulos, Nektarios
    Ioannidis, Georgios
    Vokas, Georgios
    Psomopoulos, Constantinos S.
    ELECTRONICS, 2025, 14 (02):
  • [49] A Study of the Fast Current Protection Method for the Silicon-Carbide (SiC) MOSFETs
    Nguyen, Khac-Tiu
    Nguyen, Danh-Nam
    Pham, The-Tiep
    Nguyen, Duy-Dinh
    2024 IEEE TENTH INTERNATIONAL CONFERENCE ON COMMUNICATIONS AND ELECTRONICS, ICCE 2024, 2024, : 696 - 700
  • [50] The FinFET effect in Silicon Carbide MOSFETs
    Udrea, F.
    Naydenov, K.
    Kang, H.
    Kato, T.
    Kagoshima, E.
    Nishiwaki, T.
    Fujiwara, H.
    Kimoto, T.
    2021 33RD INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2021, : 75 - 78