An Advanced Local Current-Only Protection for Microgrids: Deep-Learning-Based Approach

被引:0
|
作者
Yazdaninejadi, Amin [1 ]
Ebrahimi, Hossein [2 ]
Golshannavaz, Sajjad [2 ]
机构
[1] Shahid Rajaee Teacher Training Univ, Dept Elect Engn, Tehran 16785163, Iran
[2] Urmia Univ, Elect Engn Dept, Orumiyeh, Iran
来源
IEEE ACCESS | 2025年 / 13卷
关键词
Protection; Fault detection; Relays; Current measurement; Fault currents; Contingency management; Switches; Microgrids; Employment; Microgrid protection; fault detection strategy; operational conditions; long short-term memory (LSTM); overcurrent relays characteristics; ADAPTIVE OVERCURRENT PROTECTION; FAULT-DETECTION; COORDINATION; RELAYS; HYBRID;
D O I
10.1109/ACCESS.2025.3555123
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The integrity of protection actions in microgrids (MGs) is often compromised by varying operational conditions and contingencies. Notably, the operation of on-load tap-changers (OLTCs) can lead to the maloperation of overcurrent relays during both internal and external faults due to the altered fault current levels. This issue, combined with diverse operational conditions and other N-1 contingencies, further broadens the scope of undesirable operations. A deep-learning (DL) assisted fault detection method is introduced in this paper, which addresses the impact of OLTC operation on overcurrent protection in MGs under different operational scenarios. The proposed method utilizes a long short-term memory (LSTM) model to detect faults, taking into account the OLTC operation, on/off-grid status of the MG, outages of distributed generations (DGs), and capacitor bank switching. Additionally, various fault locations and resistances are incorporated into all simulated fault scenarios to enhance the training performance of the method. The ability of the LSTM model to interpret temporal dependencies in time-series signals allows the proposed method to rely solely on single-sourced current measurements at the relaying point, thereby reducing costs and improving module security. Simulation results on the low-voltage section of the IEEE 14-bus test system demonstrate the effectiveness of the proposed method in fault detection compared to existing approaches.
引用
收藏
页码:56428 / 56438
页数:11
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