Hybrid functionals evaluate the n-type defects in Nb, Mo and Pt doped α-Ga2 O3

被引:0
|
作者
Chang, Jinyan [1 ]
Yang, Liu [1 ]
Hu, Gongwei [1 ]
Fan, Shuaiwei [1 ,2 ]
机构
[1] China Three Gorges Univ, Dept Phys, Yichang 443002, Peoples R China
[2] China Three Gorges Univ, Hubei Engn Res Ctr Weak Magnet Field Detect, Yichang 443002, Peoples R China
基金
中国国家自然科学基金;
关键词
N -type defect; Phonon dispersion; Formation energy; Ionization energy; Defect complex; EPITAXIAL-GROWTH; GALLIUM OXIDE; STABILITY; 1ST-PRINCIPLES; SEMICONDUCTORS;
D O I
10.1016/j.mseb.2025.118033
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Based on the hybrid functionals calculations, the efficiency of the n-type defects Nb, Mo and Pt substituting Ga (labeled as NbGa, MoGa and PtGa) in alpha-Ga2O3 are fully evaluated. Obtained phonon dispersions imply the alpha-Ga2O3 containing NbGa, MoGa and PtGa defects keep the thermodynamic stability. The NbGa, MoGa and PtGa are typical ntype defects. The transition energy levels s(0/+) show defects NbGa, MoGa and PtGa in alpha-Ga2O3 could be fully ionized. With the thermodynamic equilibrium fabrication scheme, we find NbO, MoO3 and PtO2 are the optimal dopants sources, and the minimum formation energies for defects NbGa, MoGa and PtGa are -0.66 eV, 2.56 eV and 3.21 eV. Meanwhile, MoGa (PtGa) with intrinsic defect VO is highly susceptible to form defect complex VO + MoGa (VO + PtGa). These findings would provide significant insights to the n-type defects in alpha-Ga2O3.
引用
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页数:6
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