Characterization of domain wall mobility in piezoelectric single crystals from high-resolution x-ray diffraction

被引：0
|
作者：
Zhang, Nan [1 ,2 ]
Zhang, Guanjie [1 ,2 ]
Gorfman, Sem [3 ]
机构：
[1] Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab Minist Educ, Xian, Peoples R China
[2] Xi An Jiao Tong Univ, Int Ctr Dielectr Res, Sch Elect & Informat Engn, Xian, Peoples R China
[3] Tel Aviv Univ, SDept Mat Sci & Engn, Tel Aviv, Israel
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2024年 / 80卷
关键词：
D O I：
10.1107/S2053273324095548
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页数：1
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