Visualizing twisted 2D materials with electron channelling contrast imaging

被引：0
|
作者：
Tillotson, Evan [1 ,2 ]
机构：
[1] Univ Manchester, Fac Sci & Engn, Dept Mat, Manchester, England
[2] Univ Manchester, Natl Graphene Inst, Manchester, England
来源：
NATURE REVIEWS PHYSICS | 2025年 / 7卷 / 03期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1038/s42254-025-00810-y
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Evan Tillotson describes how scanning electron microscopy imaging can be used to characterize twisted 2D materials.
引用
收藏
页码：134 / 134
页数：1
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