Image distortion correction based on partial polynomial model for a large-array photon-counting detector

被引:0
|
作者
Li, Yue [1 ]
Sheng, Lizhi [1 ]
Liu, Yong'an [1 ]
Zhang, Ruili [1 ]
Yang, Xianghui [1 ]
Liu, Zhe [1 ]
Zhang, Yalong [1 ,2 ]
机构
[1] Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
Photon-counting detector; Image correction; Large-array; Partial polynomial model; DESIGN; WEDGE;
D O I
10.1007/s10043-025-00944-5
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A microchannel plates (MCPs) photon-counting detector with a cross-delay line (XDL) is expected for high-quality and wide-field target imaging. However, it is a great challenge for the uniformity of system response as the increasing of effective detection area. In this article, we develop a XDL photon-counting detector with a wide field of 120 mm x 50 mm. Additionally, we investigate the origin of image distortion and propose a partial polynomial correction method to alleviate it. The experimental results show that the drift correction index is improved by around 60% under the proposed method, which confirms that the partial polynomial correction method has general applicability and high efficiency in addressing distortion issues.
引用
收藏
页码:111 / 119
页数:9
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