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Mapping the Topological Proximity-Induced Gap in Multiterminal Josephson Junctions
被引:0
|作者:
Wisne, M.
[1
]
Deng, Y.
[1
]
Lilja, I. M. A.
[2
]
Hakonen, P. J.
[2
]
Chandrasekhar, V.
[1
]
机构:
[1] Northwestern Univ, Dept Phys & Astron, 2145 Sheridan Rd, Evanston, IL 60208 USA
[2] Aalto Univ, QTF Ctr Excellence, Dept Appl Phys, Espoo, Finland
基金:
美国国家科学基金会;
关键词:
Josephson junction devices;
D O I:
10.1103/PhysRevLett.133.246601
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
Multiterminal Josephson junctions (MTJJs), devices in which a normal metal is in contact with three or more superconducting leads, have been proposed as artificial analogs of topological crystals. The topological nature of MTJJs manifests as a modulation of the quasiparticle density of states (DOS) in the normal metal that may be probed by tunneling measurements. We show that one can reveal this modulation by measuring the resistance of diffusive MTJJs with normal contacts, which shows rich structure as a function of the phase differences { i}. Our approach demonstrates a simple yet powerful technique for exploring topological effects in MTJJs.
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