Tunneling Barrier Thickness Dependence of Spin Polarization of Ferromagnet in Magnetic Tunnel Junctions

被引:0
|
作者
Zhao, Yu-Qing [1 ]
Zuo, Hai-Yan [1 ]
Li, Shao-Wei [1 ]
Xia, Ke [2 ]
Wen, Ming [3 ]
Guo, Jun-Mei [3 ]
Xiong, Peng [4 ]
Ren, Cong [1 ,5 ]
机构
[1] Yunnan Univ, Sch Phys & Astron, Kunming 650500, Peoples R China
[2] Southeast Univ, Dept Phys, Nanjing 100193, Peoples R China
[3] Kunming Inst Precious Met, Kunming 650019, Peoples R China
[4] Florida State Univ, Phys Dept, Tallahassee, FL USA
[5] Yunnan Univ, Yunnan Key Lab Eletromagnet Mat & Devices, Kunming 650500, Peoples R China
基金
中国国家自然科学基金;
关键词
ROOM-TEMPERATURE; MAGNETORESISTANCE;
D O I
10.1088/0256-307X/41/11/117201
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
For designing low-impedance magnetic tunnel junctions (MTJs), it has been found that tunneling magnetoresistance strongly correlates with the insulating barrier thickness, imposing a fundamental problem about the relationship between spin polarization of ferromagnet and the insulating barrier thickness in MTJs. Here, we investigate the influence of alumina barrier thickness on tunneling spin polarization (TSP) through a combination of theoretical calculations and experimental verification. Our simulating results reveal a significant impact of barrier thickness on TSP, exhibiting an oscillating decay of TSP with the barrier layer thinning. Experimental verification is realized on FeNi/AlOx/Al superconducting tunnel junctions to directly probe the spin polarization of FeNi ferromagnet using Zeeman-split tunneling spectroscopy technique. These findings provide valuable insights for designs of high-performance spintronic devices, particularly in applications such as magnetic random access memories, where precise control over the insulating barrier layer is crucial.
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页数:6
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