OmniWasm: Efficient, Granular Fault Isolation and Control-Flow Integrity for Arm Microcontrollers

被引：0
|
作者：
Bai, Maorui [1 ]
Pan, Runyu [2 ]
Parmer, Gabriel [1 ]
机构：
[1] The George Washington University, United States
[2] Shandong University, China
来源：
Proceedings of the IEEE Real-Time and Embedded Technology and Applications Symposium, RTAS | 2024年
基金：
美国国家科学基金会;
关键词：
Application programs - ARM processors - Embedded systems - Microcontrollers;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：239 / 251
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