Nested deep transfer learning for modeling of multilayer thin films

被引:1
|
作者
Unni, Rohit [1 ,2 ]
Yao, Kan [1 ,2 ]
Zheng, Yuebing [1 ,2 ]
机构
[1] Univ Texas Austin, Walker Dept Mech Engn, Austin, TX 78712 USA
[2] Univ Texas Austin, Texas Mat Inst, Austin, TX 78712 USA
来源
ADVANCED PHOTONICS | 2024年 / 6卷 / 05期
基金
美国国家卫生研究院;
关键词
artificial neural networks; multilayer structures; nanophotonics; inverse design; transfer learning; NEURAL-NETWORKS; INVERSE DESIGN; NANOPHOTONICS; OPTIMIZATION; RADIATION; KNOWLEDGE;
D O I
10.1117/1.AP.6.5.056006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Machine-learning techniques have gained popularity in nanophotonics research, being applied to predict optical properties, and inversely design structures. However, one limitation is the cost of acquiring training data, as complex structures require time-consuming simulations. To address this, researchers have explored using transfer learning, where pretrained networks can facilitate convergence with fewer data for related tasks, but application to more difficult tasks is still limited. In this work, a nested transfer learning approach is proposed, training models to predict structures of increasing complexity, with transfer between each model and few data used at each step. This allows modeling thin film stacks with higher optical complexity than previously reported. For the forward model, a bidirectional recurrent neural network is utilized, which excels in modeling sequential inputs. For the inverse model, a convolutional mixture density network is employed. In both cases, a relaxed choice of materials at each layer is introduced, making the approach more versatile. The final nested transfer models display high accuracy in retrieving complex arbitrary spectra and matching idealized spectra for specific application-focused cases, such as selective thermal emitters, while keeping data requirements modest. Our nested transfer learning approach represents a promising avenue for addressing data acquisition challenges.
引用
收藏
页数:9
相关论文
共 50 条
  • [31] Modeling of a novel chikungunya virus detector based on silicon and titanium nitride multilayer thin films
    Daher M.G.
    Alsalman O.
    Ahmed N.M.
    Sassi I.
    Sorathiya V.
    Tsui H.C.L.
    Patel S.K.
    Optik, 2023, 287
  • [32] LIGHT MODULATION WITH MULTILAYER THIN-FILMS
    ITO, Y
    APPLIED OPTICS, 1974, 13 (11): : 2464 - 2465
  • [33] Multilayer Density Analysis of Cellulose Thin Films
    Sampl, Carina
    Niegelhell, Katrin
    Reishofer, David
    Resel, Roland
    Spirk, Stefan
    Hirn, Ulrich
    FRONTIERS IN CHEMISTRY, 2019, 7
  • [34] Photovoltaic properties of multilayer organic thin films
    Inoue, Junichi
    Yamagishi, Kumiko
    Yamashita, Masafumi
    JOURNAL OF CRYSTAL GROWTH, 2007, 298 : 782 - 786
  • [35] Structural characterization of thin films and multilayer structures
    Katholieke Universiteit Leuven, Leuven, Belgium
    J Phy IV JP, 3 (265-270):
  • [36] Preparation and ferroelectric characteristics of multilayer thin films
    Huazhong Univ of Science and, Technology, Wuhan, China
    Yadian Yu Shengguang/Piezoelectrics and Acoustooptics, 1997, 19 (01): : 54 - 56
  • [37] Structural characterization of thin films and multilayer structures
    Temst, K
    VanBael, MJ
    Baert, M
    Rosseel, E
    Bruyndoncx, V
    Strunk, C
    Verbanck, G
    Mae, K
    VanHaesendonck, C
    Moshchalkov, VV
    Bruynseraede, Y
    Jonckheere, R
    deGroot, DG
    Koeman, N
    Griessen, R
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C3): : 265 - 270
  • [38] Interdiffusion in Fe/Pt multilayer thin films
    Se-Young, O.
    Nguyen, Dan Phuong
    Lee, Chan-Gyu
    Koo, Bon-Heun
    Lee, Byeong-Seon
    Shimozaki, Toshitada
    Okin, Takahisa
    DIFFUSION IN SOLIDS AND LIQUIDS: MASS DIFFUSION, 2006, 258-260 : 199 - +
  • [39] Transmission electron microscopy of multilayer thin films
    Petford-Long, Amanda K.
    Chiaramonti, Ann N.
    ANNUAL REVIEW OF MATERIALS RESEARCH, 2008, 38 : 559 - 584
  • [40] Multilayer density analysis of cellulose thin films
    Sampl, Carina
    Niegelhell, Katrin
    Kontturi, Katri
    Resel, Roland
    Hirn, Ulrich
    Spirk, Stefan
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 257