Interferometric method for simultaneous characterization of retardance and fast axis of a retarder

被引：0
|
作者：
del Hoyo, Jesus [1 ]
Andres-Porras, Joaquin [1 ]
Soria-Garcia, Angela [1 ]
Sanchez-Brea, Luis Miguel [1 ]
Pastor-Villarrubia, Veronica [1 ,2 ]
Elshorbagy, Mahmoud H. [2 ,3 ]
Alda, Javier [2 ]
机构：
[1] Univ Complutense Madrid, Fac Phys, Dept Opt, Appl Opt Complutense Grp, Plaza Ciencias 1, Madrid 28040, Spain
[2] Univ Complutense Madrid, Fac Opt & Optometry, Dept Opt, Appl Opt Complutense Grp, Calle Arcos de Jalon 118, Madrid 28037, Spain
[3] Minia Univ, Fac Sci, El Minya 61519, Egypt
来源：
OPTICS AND LASERS IN ENGINEERING | 2024年 / 179卷
关键词：
Polarimetry; Retardance; Fast axis; Retarder; Interferometry; PHASE RETARDATION;
D O I：
10.1016/j.optlaseng.2024.108262
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2 degrees for the retardance and 1 degrees for the azimuth of the fast axis.
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页数：7
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