Method of measuring the practical retardance and judging the fast or slow axis of a quarter-wave plate

被引:7
|
作者
Wang, Zheng Ping [1 ]
Li, Qing Bo [1 ]
Tan, Qiao [1 ]
Huang, Zong Jun [1 ]
Shi, Jin Hui [1 ]
机构
[1] Harbin Engn Univ, Dept Phys, Sch Sci, Harbin 150001, Peoples R China
关键词
optical measurement; retardance; ellipsometry; wave plate;
D O I
10.1016/j.measurement.2006.03.005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A method used for the measurement of the practical retardance value (not considering an overall ambiguity modulo 2 pi) and the determination of the fast or slow axis of a quarter-wave plate employing two polaroids and a right-angle prism is reported. The theoretical analysis of the principle is given, the formula of uncertainty is derived, and the effects of each factor upon the uncertainty are simulated using a computer. The working conditions of this method are discussed. An application example is given and the measured result of the example is verified exploiting the results of a proving test and computer simulation, which indicate that the method is feasible. Furthermore, this method has the advantages such as easy to obtain the optical devices needed, simple to operate, and accurate etc. (C) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:729 / 735
页数:7
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