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- [1] 50 nm Overlay Accuracy for Wafer-to-wafer Bonding by High-precision Alignment Technologies 2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC, 2023, : 1664 - 1671
- [2] Distortion Simulation for Direct Wafer-to-Wafer Bonding Process 2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC, 2023, : 694 - 698
- [3] Investigation of Distortion in Wafer-to-wafer Bonding with Highly Bowed Wafers PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024, 2024, : 386 - 393
- [6] A high-precision positioning algorithm of alignment mark for wafer bonding Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2021, 42 (11): : 220 - 229
- [8] An investigation into the high strength bonding technology of wafer-to-wafer with large-scale au line 20TH ANNUAL CONFERENCE AND 9TH INTERNATIONAL CONFERENCE OF CHINESE SOCIETY OF MICRO-NANO TECHNOLOGY, 2019, 1209
- [10] Sample Preparation and Analysis on Full-Thickness Silicon Wafers for Wafer-to-Wafer Bonding Process Development ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2010, : 186 - 190