Parallel Resonant Loss Characterization of High-Frequency Magnetic Components

We propose a method to characterize losses in inductors and transformers especially suited for high operating frequencies ( ${\geq }500$ kHz). The proposed technique uses parallel resonance to directly measure the loss, i.e., the real component of a structure's complex impedance. The scheme uniquely allows for testing low-impedance devices under tests (DUTs) at high drive currents, enabling a more complete characterization of magnetic materials and components. We describe the method, analyze error mechanisms, and experimentally validate the method against alternative resonant techniques.