Trace xenon detection in ambient helium by double-pulse laser-induced breakdown spectroscopy

被引：0
|
作者：
Garrett, L. [1 ,2 ]
Burger, M. [1 ,2 ]
Lee, Y. [3 ,4 ]
Kim, H. [5 ]
Sabharwall, P. [6 ]
Choi, S. [5 ]
Jovanovic, I. [1 ,2 ]
机构：
[1] Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor,MI,48109, United States
[2] Gerard Mourou Center for Ultrafast Optical Science, University of Michigan, Ann Arbor,MI,48109, United States
[3] Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon,34141, Korea, Republic of
[4] Device Solutions, Samsung Electronics, Pyeongtaek,17786, Korea, Republic of
[5] Department of Nuclear Engineering, Seoul National University, Seoul,08826, Korea, Republic of
[6] Idaho National Laboratory, Idaho Falls,ID,83415, United States
来源：
Journal of Analytical Atomic Spectrometry | 2024年 / 40卷 / 01期
关键词：
D O I：
10.1039/d4ja00358f
中图分类号：
学科分类号：
摘要：
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页码：122 / 129
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