Analysis on single-event radiation characteristics for a bandgap reference in bulk CMOS technologies

被引：0
|
作者：
Wen, Yi [1 ]
Chen, Jianjun [1 ]
Liang, Bin [1 ]
Chi, Yaqing [1 ]
Xing, Haiyuan [1 ]
Yao, Xiaohu [1 ]
机构：
[1] College of Computer Science and Technology, National University of Defense Technology, Changsha,410073, China
来源：
Guofang Keji Daxue Xuebao/Journal of National University of Defense Technology | 2024年 / 46卷 / 04期
关键词：
Compendex;
D O I：
10.11887/j.cn.202404018
中图分类号：
学科分类号：
摘要：
Pulsed lasers
引用
收藏
页码：169 / 174
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